Pathdelay

The[signal]delaybetweenatransmitterandareceiver.Pathdelayisoftenthelargestcontributortotimetransferuncertainty.,DatapathDelayandLogicLevels-2024.1English.UltraFastDesignMethodologyGuideforFPGAsandSoCs(UG949).DocumentID:UG949;ReleaseDate:2024-05- ...,由HWittmann著作·1995·被引用17次—Abstract:Pathdelayfaulttestgenerationforstandardscandesignistopicofthiswork.Atwenty-valuedandanine-valuedlogicarep...

參考資訊如下
delay (path delay) - Glossary

The [signal] delay between a transmitter and a receiver. Path delay is often the largest contributor to time transfer uncertainty.

Datapath Delay and Logic Levels

Datapath Delay and Logic Levels - 2024.1 English. UltraFast Design Methodology Guide for FPGAs and SoCs (UG949). Document ID: UG949; Release Date: 2024-05- ...

Path delay ATPG for standard scan design

由 H Wittmann 著作 · 1995 · 被引用 17 次 — Abstract: Path delay fault test generation for standard scan design is topic of this work. A twenty-valued and a nine-valued logic are presented that are ...

用於延遲測試之調適性路徑選擇法

An Adaptive Path Selection Method for Delay Testing · 鍾文邦 · Wen-Ben Jone · 碩士 · 國立中正大學.

Standard path delay vs. critical path delay

Timing is closed when the critical path is no longer a failure (has at least 0 slack). The term is also used in a larger sense in an architecture - you can ...

使用功能敏化路徑方法產生高品質延遲缺陷樣本

由 謝旻廷 著作 · 2008 — 使用功能敏化路徑方法產生高品質延遲缺陷樣本 · High Quality Pattern Generation for Delay Defects with Functional Sensitized Paths · 摘要 · 關鍵字 · 並列摘要 ...

一個有效率機制針對可變動延遲電路設計之效能最佳化

由 王大中 著作 · 2006 — Abstract In high-performance system, it is difficult to speed up combinational circuits simply by reducing their critical path delays. Therefore, for the ...

Chapter 6 Delay Testing

Delay test is still a tough issue and still evolving. Rigorous delay testing also aims to detect “small defects” so as to reduce the test escape of latent.

12.2 Path

The path-delay fault is an important fault model used in delay testing. ... The total number of path-delay faults is twice the number of physical paths in the ...